Validator Demonstrations on a 12-port Multiplayer Gigabit Ethernet
switch on a chip, Ultra Low Power GigPHYTER(TM) V chip and a Storage

Network Processor

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    What:

    LogicVision, Inc., (NASDAQ:LGVN), a leading provider of embedded
test for integrated circuits and systems, will feature real-time
testing of three different customer chips in its booth at the upcoming
International Test Conference (ITC). Semiconductor devices from,
Broadcom Corp., National Semiconductor, and Trebia Networks will be
tested utilizing LogicVision Embedded Test solutions.

    When:

    LogicVision embedded test demonstrations will be held October
8-10, 2002, from 9:30 am to 6:00 pm (Eastern).

    Where:

    Baltimore Convention Center
    Baltimore, Md.
    Booth number -- 1411

    The Demonstration:

    The demonstration will feature LogicVision's design, debug,
diagnosis and manufacturing test products. LogicVision will be
demonstrating three major test capabilities for devices from the
following customers:

    --  Broadcom Corp. -- High Complexity Testing of a scalable
        12-port multilayer Gigabit Ethernet switch on a chip

    --  National Semiconductor -- Root Cause Debug and Diagnostics of
        a Ultra Low Power GigPHYTER(TM) V chip

    --  Trebia Networks -- Test-at-Speed of SNP-1000(TM) chip --
        Storage Network Processor

    Demonstration attendees will be presented with the following
capabilities:

    --  A structured framework for generation, integration and
        sign-off of embedded test IP

    --  Real-time hierarchical debug and diagnostics for logic,
        memory, and PLLs

    --  A vector-less transfer of test data from design to
        manufacturing

    --  ATE independent user interfaces

    --  Reusability of embedded test IP throughout the life of the SoC

About LogicVision Inc.

LogicVision (NASDAQ: LGVN) provides proprietary technologies for embedded test that enable the more efficient design and manufacture of complex semiconductors. LogicVision's embedded test solution allows integrated circuit designers to embed into a semiconductor design test functionality that can be used during semiconductor production and throughout the useful life of the chip. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.

     LogicVision
     Clarisse Balistreri, 408/453-0146
     clarisse@logicvision.com